Hongbao
Solar wafer appearance defect detection
Application Range
On solar silicon wafer production lines, the system fully automates the measurement process, avoiding human intervention and achieving high efficiency, high repeatability,
and high reliability in the detection and measurement process.
Technical Features
◆ High detection accuracy, detection of fine defects
◆ Detection accuracy is as high as 0.02mm, and very fine defects can be detected.
◆ Multiple color sorting categories, up to 24
◆ According to the color difference of silicon wafers, 24 color difference classifications are performed on silicon wafers.
◆ Multiple types of defects detected
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